• HOME >
• Technology >
• Individual Technical Service >
• Test Solution

We offer integrated test services including testing system, testing program, and fixture.

• Co-design-LSI Chip,
  Package and Mother Board
• Test Solution
• Cell Library Design and
  Development
• Analog IP Design and
  Development
• Analog Technology
• Analog IP Lineup
• IP Based System LSI
  Design
• CPU Subsystem Integrated
  Environment
• Network Device
  Verifications

We offer integrated services utilizing our development technologies, test systems, test programs and fixturing.

Our tester models can handle various type of testing from low speed to high speed.

Consistent handling from testing technique suggestions to development of Jig/program environments.

From the beginning of the test development process we facilitate test program customization for each customer. This "customized system" approach cuts costs significantly, both initially and later in the testing process.

High Quality Test Service
Our test methodology and test equipment services are designed to insure high quality results. We meet cost and quality targets by establishing streamlined operations, choosing optimal partners and through the procurement of adequate parts to meet the customers' requirements.

High Cost Performance
We practice continuous quality improvement by maintaining an integrated simulation environment.

We offer consistent service from testing method proposal to testing environment development (fixture and program development).

Analog/High-Speed Test
IP	Results (Max)	Test Item
ADC/DAC	12bit-40Msps 6bit-600Msps	Ramp Linearity,THD,ENOB SINAD,BER,etc
PLL	600MHz	Frequency Count Jitter (p-p,ST,LT,etc)
DLL	500MHz (45ps/tap)	Delay Tap Linearity
High-Speed Serial I/F	USB2.0 (480Mbps) LVDS (1.0Gbps) SATA (3.0Gbps) PCIe (2.5Gbps)	Neary Compliance Test at Speed Function
High-Speed Parallel I/F (*Controller Device)	mDDR (500Mbps) DDR2 (666Mbps)

Logic Test
DUT Specification	Results (Max)	Test Item
Number of Pin (Pad)	2,000 Pin (Pad)	IO DC
Gate Dimension	10 Million Gate	DFT (SCAN,BIST,etc) FUNCTION
Operating Frequency	500MHz
Power	5.0W	IDD (Dynamic Static)
Tester
ADVANTEST	T66xx,T65xx,T2000,T33xx
Teradyne	IP750,J750,Ultra Flex
Verigy	93k